Invention Application
- Patent Title: XRF Analyzer with Separate Source and Detector Heat Sinks
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Application No.: US15936082Application Date: 2018-03-26
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Publication No.: US20180228009A1Publication Date: 2018-08-09
- Inventor: Vincent Floyd Jones , Daniel N. Paas
- Applicant: Moxtek, Inc.
- Assignee: Moxtek, Inc.
- Current Assignee: Moxtek, Inc.
- Main IPC: H05G1/06
- IPC: H05G1/06 ; H05G1/04 ; H01J35/02 ; G21F1/10 ; G21F5/02 ; H01J37/16 ; H01J5/04 ; G01N23/223 ; A61B6/00 ; H01J9/36

Abstract:
An XRF analyzer can include an x-ray source and an x-ray detector; an x-ray source heat-sink adjacent a side of the x-ray source; and an x-ray detector heat-sink adjacent a side of the x-ray detector. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a material having a thermal conductivity of less than 20 W/(m*K). In another embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by at least 3 millimeters of a thermally insulating material. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a segment of the engine component casing. Separation of the heat sinks can help avoid heat from the x-ray source adversely affecting resolution of the x-ray detector.
Public/Granted literature
- US10219363B2 XRF analyzer with separate source and detector heat sinks Public/Granted day:2019-02-26
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