A testing system computer device for dynamically updating a test plan of an apparatus includes at least one processor in communication with at least one memory device. The testing system computer device is configured to store a plurality of historical data and generate a simulation model of the apparatus based in part on the historical data. The simulation model includes a plurality of inputs and a plurality of outputs of the apparatus. The testing system computer device is also configured to determine a plurality of tests to perform on the apparatus based on the simulation model and the plurality of historical data. The testing system computer device is further configured to receive a plurality of desirability ratings from a user, rank the plurality of tests to perform based on the plurality of desirability ratings, and present the ranked plurality of tests to the user.