- 专利标题: SUBSTRATE TESTING CARRIER AND SUBSTRATE TESTING DEVICE
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申请号: US15793881申请日: 2017-10-25
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公开(公告)号: US20180275072A1公开(公告)日: 2018-09-27
- 发明人: Shufeng Wang , Jing Wang , Peng Zhao
- 申请人: BOE TECHNOLOGY GROUP CO., LTD. , HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- 优先权: CN201710183166.5 20170324
- 主分类号: G01N21/84
- IPC分类号: G01N21/84 ; G02F1/13 ; G02F1/1335
摘要:
A substrate testing carrier and a substrate testing device are provided. The substrate testing carrier includes: a carrier body, the carrier body including a transparent carrying plate for placing a substrate to be tested, the transparent carrying plate including a first surface configured to be in contact with the substrate to be tested; at least one backlight source arranged at a side of the transparent carrying plate away from the first surface; a moving mechanism connected to the at least one backlight source and configured to move the at least one backlight source.