Invention Application
- Patent Title: OXIDE MATERIAL AND SEMICONDUCTOR DEVICE
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Application No.: US16130588Application Date: 2018-09-13
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Publication No.: US20190013407A1Publication Date: 2019-01-10
- Inventor: Shunpei YAMAZAKI , Motoki NAKASHIMA , Tatsuya HONDA
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Priority: JP2010-282135 20101217; JP2011-151859 20110708
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L29/26 ; C01G19/00 ; H01L29/04

Abstract:
An object is to provide a material suitably used for a semiconductor included in a transistor, a diode, or the like. Another object is to provide a semiconductor device including a transistor in which the condition of an electron state at an interface between an oxide semiconductor film and a gate insulating film in contact with the oxide semiconductor film is favorable. Further, another object is to manufacture a highly reliable semiconductor device by giving stable electric characteristics to a transistor in which an oxide semiconductor film is used for a channel. A semiconductor device is formed using an oxide material which includes crystal with c-axis alignment, which has a triangular or hexagonal atomic arrangement when seen from the direction of a surface or an interface and rotates around the c-axis.
Public/Granted literature
- US11049977B2 Oxide material and semiconductor device Public/Granted day:2021-06-29
Information query
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