- 专利标题: MAGNETORESISTANCE EFFECT DEVICE AND HIGH FREQUENCY DEVICE
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申请号: US16048034申请日: 2018-07-27
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公开(公告)号: US20190044500A1公开(公告)日: 2019-02-07
- 发明人: Naomichi DEGAWA , Takekazu YAMANE
- 申请人: TDK CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: TDK CORPORATION
- 当前专利权人: TDK CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2017-152725 20170807
- 主分类号: H03H11/04
- IPC分类号: H03H11/04 ; H01F10/32
摘要:
A magnetoresistance effect device includes a magnetoresistance effect element including a magnetization fixed layer, a magnetization free layer of which a direction of magnetization is changeable relative to a direction of magnetization of the fixed layer, and a spacer layer sandwiched between the fixed and free layers, a first signal line configured to generate a high frequency magnetic field when a high frequency current flows and apply the field to the magnetization free layer, and a DC application terminal configured to be capable of connecting a power supply for applying a DC current or voltage in a stacking direction of the element, and the element is disposed with respect to the terminal so the DC current flows from the fixed layer to the free layer in the element or so the DC voltage at which the magnetization fixed layer is higher in potential than the magnetization free layer is applied.
公开/授权文献
- US10439592B2 Magnetoresistance effect device and high frequency device 公开/授权日:2019-10-08
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