Invention Application
- Patent Title: OPTICAL PARAMETER MEASUREMENT DEVICE AND OPTICAL PARAMETER MEASUREMENT METHOD
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Application No.: US15970960Application Date: 2018-05-04
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Publication No.: US20190063992A1Publication Date: 2019-02-28
- Inventor: Yingying LIU , Zhen WU , Yongjun LIAO , Xing LI , Huijun MA
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Hebei
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Hebei
- Priority: CN201710774933.X 20170831
- Main IPC: G01J1/44
- IPC: G01J1/44 ; G01J1/04

Abstract:
An optical parameter measurement device and a corresponding method are provided. A light beam from a to-be-tested display panel is split by a beam-splitting assembly into at least two testing light beams. A voltage value corresponding to a first testing light beam is measured by a trans-impedance amplification circuit corresponding to a first optical sensor. Next, an integration time period is determined by a control circuit according to voltage values from the trans-impedance amplification circuit and a predetermined relational model between voltage values corresponding to the light intensities and integration time periods. A voltage value corresponding to a second testing light beam is finely measured by the integration circuit corresponding to a second optical sensor within the integration time period. Finally, the display brightness value of the to-be-tested display panel is determined by the control circuit according to a voltage value from the integration circuit within the integration time period.
Public/Granted literature
- US10401219B2 Optical parameter measurement device and optical parameter measurement method Public/Granted day:2019-09-03
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