- 专利标题: Protrusion Bump Pads for Bond-on-Trace Processing
-
申请号: US16228928申请日: 2018-12-21
-
公开(公告)号: US20190122976A1公开(公告)日: 2019-04-25
- 发明人: Yu-Min Liang , Jiun Yi Wu
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 主分类号: H01L23/498
- IPC分类号: H01L23/498 ; H01L23/48 ; H01L23/00 ; H05K1/02 ; H05K1/11 ; H05K3/40 ; H01L21/66
摘要:
A die and a substrate are provided. The die comprises at least one integrated circuit chip, and the substrate comprises first and second subsets of conductive pillars extending at least partially therethrough. Each of the first subset of conductive pillars comprises a protrusion bump pad protruding from a surface of the substrate, and the second subset of conductive pillars each partially form a trace recessed within the surface of the substrate. The die is coupled to the substrate via a plurality of conductive bumps each extending between one of the protrusion bump pads and the die.
公开/授权文献
- US10804192B2 Protrusion bump pads for bond-on-trace processing 公开/授权日:2020-10-13
信息查询
IPC分类: