• Patent Title: CAPACITANCE DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, INPUT DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME, AND METHOD OF DETECTING CAPACITANCE
  • Application No.: US16275834
    Application Date: 2019-02-14
  • Publication No.: US20190257870A1
    Publication Date: 2019-08-22
  • Inventor: Yuji SHIMADA
  • Applicant: ROHM CO., LTD.
  • Priority: JP2018-025705 20180216
  • Main IPC: G01R27/26
  • IPC: G01R27/26 H03F3/45 G06F3/044 G06F3/041
CAPACITANCE DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, INPUT DEVICE AND ELECTRONIC APPARATUS INCLUDING THE SAME, AND METHOD OF DETECTING CAPACITANCE
Abstract:
A capacitance detection circuit for measuring an electrostatic capacitance, includes: a control signal generator configured to generate a control signal; a drive circuit having a push-pull type output stage and configured to apply a drive voltage to the electrostatic capacitance according to the control signal; a current detection circuit configured to generate a detection current which is a replica of a current flowing through the output stage of the drive circuit; and an integrating circuit configured to integrate the detection current to generate a detection voltage.
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