Invention Application
- Patent Title: BEAM SCANNING APPARATUS AND OPTICAL APPARATUS INCLUDING THE SAME
-
Application No.: US16277071Application Date: 2019-02-15
-
Publication No.: US20190294019A1Publication Date: 2019-09-26
- Inventor: Junghyun PARK , Jungwoo KIM , Byunggil JEONG , Changgyun SHIN , Byounglyong CHOI
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2018-0070421 20180619
- Main IPC: G02F1/19
- IPC: G02F1/19 ; G02F1/01

Abstract:
A beam scanning apparatus includes a light source configured to emit light, and a reflective phased array device configured to reflect the light emitted from the light source and incident on the reflective phased array device, and electrically adjust a reflection angle of the reflected light reflected by the reflective phased array device, wherein the light source and the reflective phased array device are disposed such the light is incident on the reflective phased array device at an incidence angle with respect to a normal of a reflective surface of the reflective phased array device.
Public/Granted literature
- US11085996B2 Beam scanning apparatus and optical apparatus including the same Public/Granted day:2021-08-10
Information query