Invention Application
- Patent Title: INTEGRATED ION SENSING APPARATUS AND METHODS
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Application No.: US16613584Application Date: 2018-05-15
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Publication No.: US20200072783A1Publication Date: 2020-03-05
- Inventor: Helen Berney , Alan O'Donnell , Thomas O'Dwyer , Alfonso Berduque
- Applicant: ANALOG DEVICES GLOBAL UNLIMITED COMPANY
- International Application: PCT/EP2018/062505 WO 20180515
- Main IPC: G01N27/333
- IPC: G01N27/333 ; G01N27/416 ; G01N27/414

Abstract:
An integrated ion-sensitive probe is provided. In an example, an ion-sensitive probe can include a semiconductor substrate and a first passive electrode attached to the semiconductor substrate. The first passive electrode can be configured to contact a solution and to provide a first electrical voltage as function of a concentration of an ion within the solution. In certain examples, a passive reference electrode can be co-located on the semiconductor substrate. In some examples, processing electronics can be integrated on the semiconductor substrate.
Public/Granted literature
- US12117415B2 Integrated ion sensing apparatus and methods Public/Granted day:2024-10-15
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