Invention Application
- Patent Title: CONDITION MONITORING APPARATUS, CONDITION MONITORING SYSTEM, AND CONDITION MONITORING METHOD
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Application No.: US16604952Application Date: 2018-04-04
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Publication No.: US20200158562A1Publication Date: 2020-05-21
- Inventor: Wataru HATAKEYAMA , Makoto MIYAZAKI , Takashi HASEBA , Yosuke SUZUKI
- Applicant: NTN CORPORATION
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1cf1e401 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@f1e6e27 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6e71bdb0 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4ec15a90
- International Application: PCT/JP2018/014381 WO 20180404
- Main IPC: G01H1/00
- IPC: G01H1/00 ; G01M13/028 ; G01P7/00

Abstract:
A data processing device includes a peak detector that detects a peak from a frequency spectrum and a map generator that generates an abnormality map for the frequency spectrum. The abnormality map includes as abnormal components, a frequency of a detected peak of interest and a frequency of a peak that appears together with the peak of interest when the peak of interest is assumed as the peak originating from abnormality. The data processing device includes an abnormal peak extractor that extracts as an abnormal peak, a peak at a frequency that matches with any of the abnormal components included in the abnormality map and a first criterion value calculator that calculates a first criterion value representing occurrence of abnormality corresponding to the abnormality map based on a spectral density of the abnormal peak.
Public/Granted literature
- US11441940B2 Condition monitoring apparatus, condition monitoring system, and condition monitoring method Public/Granted day:2022-09-13
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