Invention Application
- Patent Title: X-ray Phase Contrast Imaging Apparatus
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Application No.: US16319574Application Date: 2017-07-10
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Publication No.: US20200158662A1Publication Date: 2020-05-21
- Inventor: Akira HORIBA , Koichi TANABE , Toshinori YOSHIMUTA , Kenji KIMURA , Hiroyuki KISHIHARA , Yukihisa WADA , Takuro IZUMI , Taro SHIRAI , Takahiro DOKI , Satoshi SANO , Takayoshi SHIMURA , Heiji WATANABE , Takuji HOSOI
- Applicant: Shimadzu Corporation , OSAKA UNIVERSITY
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@19dec0f6
- International Application: PCT/JP2017/025141 WO 20170710
- Main IPC: G01N23/041
- IPC: G01N23/041 ; A61B6/00

Abstract:
This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).
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