A feature recognition structure provided by the embodiments of the present disclosure comprises: a plurality of first electrodes and a plurality of second electrodes disposed on a base substrate, wherein orthogonal projections of the plurality of first electrodes and of the plurality of second electrodes on the base substrate intersect each other to form a plurality of overlap regions; and a plurality of functional patterns disposed between one or more of the plurality of first electrodes and corresponding one or more of the plurality of second electrodes, wherein an orthogonal projection of each of the plurality of functional patterns on the base substrate is located in a corresponding one of the plurality of overlap regions; the functional patterns comprise at least one piezoelectric material, and have at least two types of sub-patterns, and different types of the sub-patterns have substantially different piezoelectric coefficients.