An inspection system includes one or more processors that obtain a first image of a work piece that has a fluorescent dye thereon in an ultraviolet (UV) light setting and a second image of the work piece in a visible light setting. The first and second images are generated by one or more imaging devices in the same position relative to the work piece. The one or more processors identify a candidate region of the first image based on a light characteristic of one or more pixels, and determine a corresponding candidate region of the second image that is at an analogous location as the candidate region of the first image. The one or more processors analyze both candidate regions to detect a potential defect on a surface of the work piece and a location of the potential defect relative to the surface of the work piece.