发明申请
- 专利标题: DATA POINT GROUP CLUSTERING METHOD, GUIDE INFORMATION DISPLAY DEVICE, AND CRANE
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申请号: US16632779申请日: 2018-07-19
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公开(公告)号: US20200167940A1公开(公告)日: 2020-05-28
- 发明人: Takayuki KOSAKA , Iwao ISHIKAWA , Satoshi KUBOTA , Shigenori TANAKA , Kenji NAKAMURA , Yuhei YAMAMOTO , Masaya NAKAHARA
- 申请人: TADANO LTD. , THE SCHOOL CORPORATION KANSAI UNIVERSITY
- 申请人地址: JP Kagawa JP Osaka
- 专利权人: TADANO LTD.,THE SCHOOL CORPORATION KANSAI UNIVERSITY
- 当前专利权人: TADANO LTD.,THE SCHOOL CORPORATION KANSAI UNIVERSITY
- 当前专利权人地址: JP Kagawa JP Osaka
- 优先权: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@5b7e392e
- 国际申请: PCT/JP2018/027183 WO 20180719
- 主分类号: G06T7/521
- IPC分类号: G06T7/521 ; G06T19/00 ; B66C13/16 ; B66C23/90 ; B60R1/00 ; G01S17/42
摘要:
Provided is a method for clustering the data point groups of one or more measurement targets located in the same region from among the acquired data point groups. This method is provided with: acquiring a data point group in a region that contains a measurement target from above the measurement target by using a laser scanner; clustering the data point groups that correspond to the top surface of the measurement target as a planar cluster by using a data processing unit; extracting a reference planar cluster which is a reference for making a same-region determination; calculating the difference in height between the reference planar cluster and other planar clusters, and searching for planar clusters exhibiting a height difference within a prescribed threshold; selecting one planar cluster exhibiting a height difference within the prescribed threshold; detecting whether there is overlap between the reference planar cluster and the one planar cluster; and clustering the planar clusters as clusters in the same region when overlap is detected.
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