Invention Application
- Patent Title: SIGNAL PROCESSING METHOD AND IMAGING SYSTEM FOR SCATTER CORRECTION IN COMPUTED TOMOGRAPHY
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Application No.: US16782584Application Date: 2020-02-05
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Publication No.: US20200170599A1Publication Date: 2020-06-04
- Inventor: Xue Rui , Mingye Wu , Yannan Jin , Peter Michael Edic , Bruno Kristiaan Bernard De Man
- Applicant: General Electric Company
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B6/03

Abstract:
A signal processing method is disclosed, which includes detecting a total intensity of X-rays passing through an object comprising multiple materials; obtaining at least one set of basis information of basis material information of the multiple materials and basis component information of photon-electric absorption basis component and Compton scattering basis component of the object; estimating a scatter intensity component of the detected X-rays based on the at least one set of basis information and the detected total intensity; and obtaining an intensity estimate of primary X-rays incident on a detector based on the detected total intensity and the estimated scatter intensity component. An imaging system adopting the above signal processing method is also disclosed.
Public/Granted literature
- US11134907B2 Signal processing method and imaging system for scatter correction in computed tomography Public/Granted day:2021-10-05
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