Embodiments include methods for selective electroless plating of dielectric layers and devices formed by such processes. According to an embodiment, patterned surfaces are formed in a dielectric layer that includes metallic ceramic fillers. In some embodiments, the patterned surfaces form a line opening and a via opening that exposes a conductive pad. In an embodiment, the metallic ceramic fillers are activated to form activated surfaces over the patterned surfaces. A first metal is then deposited into the via opening with a first electroless solution that is a bottom-up deposition process. Thereafter, embodiments include forming a seed layer over exposed portions of the activated surfaces. In an embodiment, mid-gap states of the activated surfaces have an energy level approximately equal to a reduction potential of metal ions in a second electroless solution. Embodiments may then include depositing a second metal into the via opening with a third electroless solution.