Invention Application
- Patent Title: IMAGING CONDITION EVALUATION DEVICE AND IMAGING CONDITION EVALUATION METHOD
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Application No.: US16835371Application Date: 2020-03-31
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Publication No.: US20200309600A1Publication Date: 2020-10-01
- Inventor: Yuki YAMAMOTO , Ryohei KURI
- Applicant: Seiko Epson Corporation
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@568be2ec
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/10

Abstract:
An imaging condition evaluation device according to the present disclosure includes: a spectrometer configured to capture a spectral image under an arbitrarily set imaging condition; and an evaluation unit configured to set a first region and a second region different from each other in the spectral image, and calculate an evaluation value of the imaging condition based on an optical spectrum of the first region and an optical spectrum of the second region.
Public/Granted literature
- US11099071B2 Imaging condition evaluation device and imaging condition evaluation method Public/Granted day:2021-08-24
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