- 专利标题: METHOD AND ELECTRONIC DEVICE FOR CORRECTING MEASUREMENT VALUE OF SENSOR
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申请号: US16759121申请日: 2018-10-19
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公开(公告)号: US20210034195A1公开(公告)日: 2021-02-04
- 发明人: Jeehoon LEE , Eungi MIN , Yongjin LEE , Suho LEE , Sukwang LIM , Hyungjoon LIM , Seungeun LEE
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 优先权: KR10-2017-0146045 20171103
- 国际申请: PCT/KR2018/012409 WO 20181019
- 主分类号: G06F3/044
- IPC分类号: G06F3/044 ; G06F3/041 ; H03K17/96
摘要:
An electronic device according to various embodiments of the present invention may comprise: at least one electrode having conductivity; a capacitance sensor, at least one switch electrically connected between the at least one electrode and the capacitance sensor, and capable of selectively connecting the at least one electrode and the capacitance sensor; and a control circuit, wherein the control circuit measures a first capacitance value by using the capacitance sensor in a state where the at least one switch is open, measures a second capacitance value corresponding to an external object contacting the at least one electrode, by using the capacitance sensor in a state where the at least one switch is connected, corrects the second capacitance value by using the first capacitance value, and determines the corrected second capacitance value as a capacitance value for the external object. Various other embodiments are possible.