Methods and apparatus are provided for testing computing devices. A host computing device is provided for testing devices under test (DUTs) using a test suite that includes first and second tests. The DUTs can include a first group of DUTs with a first DUT and a second group of DUTs with a second DUT. The first and second groups of DUTs can share a common design. The host computing device can determine that the DUTs execute the first test before the second test. The host computing device can receive failing first test results for the first DUT. The host computing device can determine, based on the first test results and that the first and second DUT groups share a common design, to execute the second test before the first test and can subsequently instruct the second DUT to execute the second test before the first test.