- 专利标题: LITHOGRAPHIC APPARATUS AND COOLING METHOD
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申请号: US16604976申请日: 2018-01-31
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公开(公告)号: US20210132514A1公开(公告)日: 2021-05-06
- 发明人: Gosse Charles DE VRIES , Nicolaas TEN KATE
- 申请人: ASML Netherlands B.V.
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 优先权: EP17165857.8 20170411
- 国际申请: PCT/EP2018/052391 WO 20180131
- 主分类号: G03F7/20
- IPC分类号: G03F7/20
摘要:
A lithographic apparatus arranged to project a pattern from a patterning device onto a substrate, comprising at least one housing comprising at least one internal wall, at least one optical component arranged within at least one chamber defined at least in part by the at least one internal wall and configured to receive a radiation beam and a cooling apparatus arranged to cool at least a portion of the at least one internal wall to a temperature below that of the at least one optical component.
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