Invention Application
- Patent Title: SYSTEM AND METHODS FOR SEQUENTIAL SCAN PARAMETER SELECTION
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Application No.: US16703547Application Date: 2019-12-04
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Publication No.: US20210174496A1Publication Date: 2021-06-10
- Inventor: Pavan Annangi , Hariharan Ravishankar , Tore Bjaastad , Erik Normann Steen , Svein Arne Aase , Rohan Patil
- Applicant: GE Precision Healthcare LLC
- Applicant Address: US WI Milwaukee
- Assignee: GE Precision Healthcare LLC
- Current Assignee: GE Precision Healthcare LLC
- Current Assignee Address: US WI Milwaukee
- Main IPC: G06T7/00
- IPC: G06T7/00 ; A61B8/08

Abstract:
Methods and systems are provided for sequentially selecting scan parameter values for ultrasound imaging. In one example, a method includes selecting a first parameter value for the a first scan parameter based on an image quality of each ultrasound image of a first plurality of ultrasound images of an anatomical region, each ultrasound image of the first plurality of ultrasound images having a different parameter value for the first scan parameter, selecting a second parameter value for a second scan parameter based on an image quality of each ultrasound image of a second plurality of ultrasound images of the anatomical region, each ultrasound image of the second plurality of ultrasound images having a different parameter value for the second scan parameter, and applying the first parameter value for the first scan parameter and the second parameter value for the second scan parameter to one or more additional ultrasound images.
Public/Granted literature
- US11308609B2 System and methods for sequential scan parameter selection Public/Granted day:2022-04-19
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