Invention Application
- Patent Title: SYSTEMS AND METHODS FOR GENERATING DIAGNOSTIC SCAN PARAMETERS FROM CALIBRATION IMAGES
-
Application No.: US16711120Application Date: 2019-12-11
-
Publication No.: US20210177295A1Publication Date: 2021-06-17
- Inventor: André de Almeida Maximo , Dattesh Dayanand Shanbhag , Chitresh Bhushan , Dawei Gui
- Applicant: GE Precision Healthcare LLC
- Applicant Address: US WI Milwaukee
- Assignee: GE Precision Healthcare LLC
- Current Assignee: GE Precision Healthcare LLC
- Current Assignee Address: US WI Milwaukee
- Main IPC: A61B5/055
- IPC: A61B5/055 ; G01R33/54 ; G06T7/00

Abstract:
Methods and systems are provided for determining diagnostic-scan parameters for a magnetic resonance (MR) diagnostic-scan, from MR calibration images, enabling acquisition of high-resolution diagnostic images of one or more anatomical regions of interest, while bypassing acquisition of localizer images, increasing a speed and efficiency of MR diagnostic-scanning. In one embodiment, a method for a magnetic resonance imaging (MRI) system comprises, acquiring a magnetic resonance (MR) calibration image of an imaging subject, mapping the MR calibration image to a landmark map using a trained deep neural network, determining one or more diagnostic-scan parameters based on the landmark map, acquiring an MR diagnostic image according to the diagnostic-scan parameters, and displaying the MR diagnostic image via a display device.
Information query