Invention Application
- Patent Title: Method and apparatus for detecting thickness of paper and storage medium
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Application No.: US16982600Application Date: 2019-05-17
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Publication No.: US20210209745A1Publication Date: 2021-07-08
- Inventor: Li JIANG , Rongxin SONG , Xiumei QI , Jie XIAN
- Applicant: WEIHAI HUALING OPTO-ELECTRONICS CO., LTD.
- Applicant Address: CN Weihai, Shandong
- Assignee: WEIHAI HUALING OPTO-ELECTRONICS CO., LTD.
- Current Assignee: WEIHAI HUALING OPTO-ELECTRONICS CO., LTD.
- Current Assignee Address: CN Weihai, Shandong
- Priority: CN201811075178.7 20180914
- International Application: PCT/CN2019/087344 WO 20190517
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01B11/06 ; G06T5/50 ; G07D7/164

Abstract:
Provided are a method and an apparatus for detecting a thickness of parer, and a storage medium. The method includes: acquiring a first thickness image of a target paper; extracting at least one first thickness feature and at least one second thickness feature from the first thickness image in the first thickness image; performing average processing on gray values of multiple pixel points in the at least one first thickness feature to acquire a first gray value, and the average processing is performed on gray values of the multiple pixel points in the at least one second thickness feature to acquire a second gray value, when the first gray value is, smaller than the second gray value of multiple pixel points in at least one second thickness feature, determining that a thickness of a region, corresponding to the at least one second thickness feature, on the target paper has changed.
Public/Granted literature
- US11741591B2 Method and apparatus for detecting thickness of paper and storage medium Public/Granted day:2023-08-29
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