METHOD FOR PROCESSING SPIN MAGNETOMETRY DATA
摘要:
The present invention provides method for processing spin magnetometry data of a sample, said data generated with a point defects-based spin magnetometer, and for providing information on the presence and properties of a particular compound in the sample, wherein said method comprises: (1) Subjecting the sample to a spin magnetometry measurement with the point defects-based spin magnetometer to generate a string or an array of the spin measurement results of said sample, said string or an array of the spin measurement results is an input for an external memory; and (2) Applying a deep-learning method on said spin measurement results in the external memory to output a single bit whose value is ‘0’ or ‘1’, or an array of bits, or an array of integers, or an array of complex numbers, wherein said single bit, or said array of bits, or said array of integers, or said array of complex numbers corresponds to an estimated frequency and/or an amplitude of the input, thereby providing information on the presence and properties of said compound in the sample.
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