- 专利标题： APPARATUSES, SYSTEMS, AND METHODS FOR SAMPLE TESTING
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申请号： US17447995申请日： 2021-09-17
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公开(公告)号： US20220003668A1公开(公告)日： 2022-01-06
- 发明人: Chen FENG , Suresh VENKATARAYALU , Robert Timothy KESTER
- 申请人： Hand Held Products, Inc.
- 申请人地址： US NC Charlotte
- 专利权人： Hand Held Products, Inc.
- 当前专利权人： Hand Held Products, Inc.
- 当前专利权人地址： US NC Charlotte
- 主分类号： G01N21/45
- IPC分类号： G01N21/45 ; G02B6/42
摘要：
Methods, apparatuses, and systems associated with a sample testing device are provided. For example, an example sample testing device may include a substrate layer defining a bottom surface of the sample testing device, as well as a waveguide disposed on the substate layer and includes at least one reference channel and at least one sample channel.
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