- 专利标题: METROLOGY SENSOR FOR POSITION METROLOGY
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申请号: US17277353申请日: 2019-08-27
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公开(公告)号: US20220035257A1公开(公告)日: 2022-02-03
- 发明人: Sebastianus Adrianus GOORDEN , Simon Reinald HUISMAN , Simon Gijsbert Josephus MATHIJSSEN , Henricus Petrus Maria PELLEMANS
- 申请人: ASML Netherlands B.V.
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 优先权: EP18195488.4 20180919,EP19150245.9 20190103
- 国际申请: PCT/EP2019/072762 WO 20190827
- 主分类号: G03F7/20
- IPC分类号: G03F7/20
摘要:
Disclosed is a metrology device (1600) configured to produce measurement illumination comprising a plurality of illumination beams, each of said illumination beams being spatially incoherent or pseudo-spatially incoherent and comprising multiple pupil points in an illumination pupil of the metrology device. Each pupil point in each one of said plurality of illumination beams has a corresponding pupil point in at least one of the other illumination beams of said plurality of illumination beams thereby defining multiple sets of corresponding pupil points, and the pupil points of each set of corresponding pupil points are spatially coherent with respect to each other.
公开/授权文献
- US11360399B2 Metrology sensor for position metrology 公开/授权日:2022-06-14
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