- 专利标题: ION BEAM PATHS ON TARGET SURFACES FOR NEUTRON BEAM GENERATION
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申请号: US17412943申请日: 2021-08-26
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公开(公告)号: US20220070994A1公开(公告)日: 2022-03-03
- 发明人: Gregory Luke Snitchler , Shahyar Ziaei , Harrison Beam Eggers , Alejandro Mesa Dame
- 申请人: TAE Technologies, Inc.
- 申请人地址: US CA Foothill Ranch
- 专利权人: TAE Technologies, Inc.
- 当前专利权人: TAE Technologies, Inc.
- 当前专利权人地址: US CA Foothill Ranch
- 主分类号: H05H7/00
- IPC分类号: H05H7/00 ; H05H6/00 ; A61N5/10
摘要:
Embodiments of systems, devices, and methods relate to selecting a raster profile for scanning a proton beam across a target. A raster profile is selected from among the plurality of plurality of possible raster profiles based on a value of a figure of merit. A beam is directed across the target surface to form a pattern that is repeated one or more times at different radial orientations to form a scanning profile. A target temperature is monitored while scanning the beam across the target surface according to the scanning profile. The scanning parameters are changeable to avoid target damaging, to improve thermal performance and to optimize particle loading.
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