An integrated multifunctional environmental characterization system (IMECS) is provided. The IMECS may comprises a memory, one or more interfaces and a processor. The processor may be configured to predict an environment condition adjacent to a thin film using one or more machine learned models from one or more measured properties of the thin film received via the one or more interfaces; and/or predict values for one or more properties of the thin film using the one or more machine learned models from an environmental condition received via one of the one or more interfaces; and display the predicted environment condition and/or the predicted one or more properties. The processor may also adjust the acquisition parameters used to acquire values of one or more properties of the thin film from received acquisition parameters via a user interface based on measured values for the same properties.