A system of a machine includes a waveguide system and a radio frequency transceiver/detector coupled to the waveguide system and configured to emit a calibration signal in the waveguide system to establish a reference baseline between the radio frequency transceiver/detector and a calibration plane associated with an aperture of the waveguide system, emit a measurement signal in the waveguide system to transmit a radio frequency signal from the radio frequency transceiver/detector out of the aperture of the waveguide system, and detect a reflection of the measurement signal at the radio frequency transceiver/detector based on an interaction between the measurement signal and a component of the machine. A measurement result of the reflection of the measurement signal can be adjusted with respect to a reflection of the calibration signal.