- 专利标题: Photonic Die Alignment
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申请号: US17553904申请日: 2021-12-17
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公开(公告)号: US20220107474A1公开(公告)日: 2022-04-07
- 发明人: Diedrik Vermeulen , Ehsan Shah Hosseini , Michael J. Whitson
- 申请人: Analog Photonics LLC
- 申请人地址: US MA Boston
- 专利权人: Analog Photonics LLC
- 当前专利权人: Analog Photonics LLC
- 当前专利权人地址: US MA Boston
- 主分类号: G02B6/42
- IPC分类号: G02B6/42
摘要:
A first photonic die has a first coupling edge and a first die surface, and comprises: a first waveguide extending in proximity to the first coupling edge; a portion of the first die surface forming an alignment edge substantially parallel to the first waveguide; and a first alignment feature etched into or formed adjacent to the first coupling edge. A second photonic die has a second coupling edge and a second die surface, and comprises: a second waveguide extending in proximity to the second coupling edge; a portion of the second die surface configured to form a receptacle sized to constrain a position of the alignment edge; and a second alignment feature etched into or formed adjacent to the second coupling edge and configured to enable alignment with the first alignment feature when the first photonic die and the second photonic die are substantially aligned with each other.
公开/授权文献
- US11693196B2 Photonic die alignment 公开/授权日:2023-07-04
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