Invention Application
- Patent Title: EARLY MEASUREMENT REPORTING
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Application No.: US17422164Application Date: 2020-01-16
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Publication No.: US20220116809A1Publication Date: 2022-04-14
- Inventor: Peng CHENG , Huichun LIU , Gavin Bernard HORN , Ozcan OZTURK , Masato KITAZOE , Prasad Reddy KADIRI , Punyaslok PURKAYASTHA
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Priority: CNPCT/CN2019/072370 20190118,CNPCT/CN2019/075550 20190220,CNPCT/CN2019/077770 20210312
- International Application: PCT/CN20/72385 WO 20200116
- Main IPC: H04W24/10
- IPC: H04W24/10 ; H04W76/19 ; H04W76/30 ; H04W56/00

Abstract:
Certain aspects of the present disclosure provide techniques performing measurement reporting. One aspect is a method for performing measurement reporting at a user equipment, including: receiving, from a master node, a message comprising a measurement configuration for a secondary node; entering an inactive state; performing measurements according to the measurement configuration for the secondary node immediately after entering the inactive state; generating a measurement report based on the measurements; transmitting, to the master node, an RRC resume request message; receiving, from the master node, an RRC resume message comprising a request for measurement reporting; and transmitting, to the master node, an RRC resume complete message comprising the measurement report; and receiving data from the secondary node.
Public/Granted literature
- US12069500B2 Early measurement reporting Public/Granted day:2024-08-20
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