Invention Application
- Patent Title: DEEP LEARNING BASED MAGNETIC RESONANCE IMAGING (MRI) EXAMINATION ACCELERATION
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Application No.: US17083074Application Date: 2020-10-28
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Publication No.: US20220128640A1Publication Date: 2022-04-28
- Inventor: Sudhanya Chatterjee , Dattesh Shanbhag , Suresh Joel
- Applicant: GE Precision Healthcare LLC
- Applicant Address: US WI Wauwatosa
- Assignee: GE Precision Healthcare LLC
- Current Assignee: GE Precision Healthcare LLC
- Current Assignee Address: US WI Wauwatosa
- Main IPC: G01R33/56
- IPC: G01R33/56 ; A61B5/055 ; G06T7/00 ; G01R33/48 ; G01R33/483 ; G06K9/62

Abstract:
Systems and methods for deep learning based magnetic resonance imaging (MRI) examination acceleration are provided. The method of deep learning (DL) based magnetic resonance imaging (MRI) examination acceleration comprises acquiring at least one fully sampled reference k-space data of a subject and acquiring a plurality of partial k-space of the subject. The method further comprises grafting the plurality of partial k-space with the at least one fully sampled reference k-space data to generate a grafted k-space for accelerated examination. The method further comprises training a deep learning (DL) module using the fully sampled reference k-space data and the grafted k-space to remove the grafting artifacts.
Public/Granted literature
- US11885862B2 Deep learning based magnetic resonance imaging (MRI) examination acceleration Public/Granted day:2024-01-30
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