• Patent Title: MONITORING METHOD, MONITORING APPARATUS, AND PROGRAM
  • Application No.: US17437719
    Application Date: 2020-02-26
  • Publication No.: US20220128984A1
    Publication Date: 2022-04-28
  • Inventor: Kiyoshi KATO
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • Priority: JP2019-051169 20190319
  • International Application: PCT/JP2020/007820 WO 20200226
  • Main IPC: G05B23/02
  • IPC: G05B23/02
MONITORING METHOD, MONITORING APPARATUS, AND PROGRAM
Abstract:
A monitoring apparatus according to the present invention includes: a control unit configured to confirm whether a measured value detected from a monitored object satisfies a preset condition, and execute processing for the monitored object set correspondingly to the condition in a case where the measured value satisfies the condition; and a recording processing unit configured to record an execution status of the processing for the monitored object into preset schedule data.
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