Invention Application
- Patent Title: INTERNAL POSITIVE CONTROL FOR DIAGNOSTIC ASSAYS
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Application No.: US17516909Application Date: 2021-11-02
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Publication No.: US20220134329A1Publication Date: 2022-05-05
- Inventor: Joyce WU , Edward Joseph DANYLIW , David BOLOGNIA , Jiawen BAI
- Applicant: Analog Devices, Inc.
- Applicant Address: US MA Wilmington
- Assignee: Analog Devices, Inc.
- Current Assignee: Analog Devices, Inc.
- Current Assignee Address: US MA Wilmington
- Main IPC: B01L3/00
- IPC: B01L3/00

Abstract:
A method of verifying proper functionalization of a sensor and a negative test result obtained by exposing a sensing element functionalized to detect a target analyte to a test sample is described. The method may include, subsequent to or simultaneously with the exposing the sensing element to the test sample, exposing the sensing element to a test confirmation sample, the test confirmation sample comprising at least one of the target analyte in an amount greater than a detection limit of the sensing element and a recombinant protein of the target analyte in an amount greater than a detection limit of the sensing element and performing a measurement using the sensing element to obtain a subsequent test result.
Information query
IPC分类: