• Patent Title: STRUCTURE DIAGNOSIS APPARATUS, STRUCTURE DIAGNOSIS METHOD, AND COMPUTER-READABLE RECORDING MEDIUM
  • Application No.: US17435482
    Application Date: 2020-01-16
  • Publication No.: US20220137003A1
    Publication Date: 2022-05-05
  • Inventor: Shohei KINOSHITAShigeru KASAIYu KIYOKAWA
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • Priority: JP2019-040049 20190305
  • International Application: PCT/JP2020/001377 WO 20200116
  • Main IPC: G01N29/12
  • IPC: G01N29/12
STRUCTURE DIAGNOSIS APPARATUS, STRUCTURE DIAGNOSIS METHOD, AND COMPUTER-READABLE RECORDING MEDIUM
Abstract:
A structure diagnosis apparatus 1 for diagnosing a state of a structure in which there is a small change in the natural frequency includes: a natural vibration extraction unit 2 configured to acquire, from a plurality of sensors 21 that a structure is provided with 20, vibration information indicating vibration generated in the structure 20, and extracting natural vibration using the vibration information; a spectral shape extraction unit 3 configured to extract spectral shape information indicating a shape of a spectrum using the natural vibration; an index calculation unit 4 for calculating an index indicating a relationship between the spectral shape information and reference spectral shape information that is a preset reference; and a state estimation unit 5 for estimating the state of the structure based on the index.
Information query
Patent Agency Ranking
0/0