Invention Application
- Patent Title: MONITORING METHOD, MONITORING APPARATUS, AND PROGRAM
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Application No.: US17437740Application Date: 2020-02-26
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Publication No.: US20220147032A1Publication Date: 2022-05-12
- Inventor: Kiyoshi KATO
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP2019-051170 20190319
- International Application: PCT/JP2020/007821 WO 20200226
- Main IPC: G05B23/02
- IPC: G05B23/02

Abstract:
A monitoring apparatus according to the present invention includes: a detecting unit configured to detect that a monitored object is in a preset specific state based on a plurality of measured values measured from the monitored object; and a specifying unit configured to specify, among elements causing the measured values, the element related to detection of the specific state of the monitored object based on the measured values, and also specify the element based on preset properties of the elements of the measured values.
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