Invention Application
- Patent Title: METHOD AND SYSTEM FOR LOCALIZING AN ANOMALY IN AN IMAGE TO BE DETECTED, AND METHOD FOR TRAINING RECONSTRUCTION MODEL THEREOF
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Application No.: US17190597Application Date: 2021-03-03
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Publication No.: US20220156513A1Publication Date: 2022-05-19
- Inventor: Hyun Yong LEE , Nack Woo KIM , Sang Jun PARK , Byung Tak LEE , Jun Gi LEE
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Priority: KR10-2020-0152885 20201116
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/11 ; G06T5/50

Abstract:
Provided is a method of localizing an anomaly in a target image. The method includes training a reconstruction model using a normal image, deriving a reconstructed image by applying a target image, which is subject to detection, to the trained reconstruction model, generating an anomaly map on the basis of a result of comparing the reconstructed image and the target image, and localizing an anomaly through the generated anomaly map.
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