Invention Application
- Patent Title: CALIBRATION TOOL AND METHOD
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Application No.: US17599321Application Date: 2020-03-13
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Publication No.: US20220163322A1Publication Date: 2022-05-26
- Inventor: Egbert Grietinus KELLIJ , John VAN DE VRUGT , Niels TIELENBURG , Teunis Johannes VERBRUGGEN , Peter BEEKMAN , Cees Johan VAN VOSKUILEN , Robin NUSSELDER , Gerjan Asuerus BERGHORST , Titus Ruben VERLAAN , Bart KOFOED , Quinten Matthijs BERGMANS
- Applicant: VMI HOLLAND B.V.
- Applicant Address: NL Epe
- Assignee: VMI HOLLAND B.V.
- Current Assignee: VMI HOLLAND B.V.
- Current Assignee Address: NL Epe
- Priority: NL2022874 20190405
- International Application: PCT/NL2020/050167 WO 20200313
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G01C11/30 ; G01S7/497 ; B29D30/00 ; B29D30/24 ; B29D30/26 ; B29D30/32 ; B29D30/48

Abstract:
The invention relates to a calibration tool and a method for calibrating a laser-triangulation measuring system, wherein the calibration tool comprises a tool body that defines a reference plane and that is rotatable relative to the measuring system about a rotation axis perpendicular to said reference plane, wherein the tool body is provided with one or more calibration surfaces that define a pattern of calibration positions, wherein the pattern comprises at least three columns extending in a radial direction away from the rotation axis and at least three rows extending in a circumferential direction about the rotation axis, wherein for each column the calibration positions within said respective column vary in height relative to the reference plane in a height direction perpendicular to said reference plane and wherein for each row the calibration positions within the respective row vary in height in the height direction relative to the reference plane.
Public/Granted literature
- US12085381B2 Calibration tool and method Public/Granted day:2024-09-10
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