Invention Application
- Patent Title: Surveying Instrument, Surveying Method And Surveying Program
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Application No.: US17527421Application Date: 2021-11-16
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Publication No.: US20220163328A1Publication Date: 2022-05-26
- Inventor: Fumio Ohtomo , Takeshi Sasaki , Kaoru Kumagai
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Priority: JP2020-195717 20201126
- Main IPC: G01C15/00
- IPC: G01C15/00 ; G01C15/02

Abstract:
Provided is a surveying instrument including a distance measuring module configured to measure a distance to an object, an optical axis deflector configured to deflect the distance measuring light, a measuring direction image pickup module configured to acquire an observation image, an arithmetic control module, and an operation panel includes a display module, the arithmetic control module is configured to cause the optical axis deflector to perform a scan with a predetermined scan pattern and create an overlay image as a superimposition of the locus of the scan pattern on the observation image, and calculate a formula of a straight line or a curve line based on a measurement result of intersections or the closest points to the intersections between the straight line or the curve line drawn along a ridge line or a contour of the object and the locus of the scan pattern on the displayed overlay image.
Information query