Invention Application
- Patent Title: Analysis and Testing of Embedded Code
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Application No.: US16953500Application Date: 2020-11-20
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Publication No.: US20220164277A1Publication Date: 2022-05-26
- Inventor: Shachar Menashe , Ilya Khivrich , Asaf Karas
- Applicant: VDOO CONNECTED TRUST LTD.
- Applicant Address: IL Tel Aviv
- Assignee: VDOO CONNECTED TRUST LTD.
- Current Assignee: VDOO CONNECTED TRUST LTD.
- Current Assignee Address: IL Tel Aviv
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F8/65 ; G06F8/52

Abstract:
A method, system and product comprising determining a characterization of a terminal of a plurality of terminals within a binary code based on influences of the terminal, wherein the characterization of the terminal indicates a role of the terminal in the binary code; based on the characterization of the terminal, determining that the terminal is potentially affected by external input that is inputted to a device executing the binary code; determining for the terminal a corresponding propagation path within the binary code, wherein the propagation path indicates a reachability of the terminal within the binary code; locating in the binary code a code patch associated with a functionality of the binary code, wherein the code patch is associated with the propagation path of the terminal, wherein the code patch can be executed independently from the binary code; extracting the code patch from the binary code for testing; and generating an emulation of the code patch to enable fuzz testing of the emulation, whereby the code patch is tested independently.
Public/Granted literature
- US11573887B2 Extracting code patches from binary code for fuzz testing Public/Granted day:2023-02-07
Information query