- 专利标题: Analysis and Testing of Embedded Code
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申请号: US16953500申请日: 2020-11-20
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公开(公告)号: US20220164277A1公开(公告)日: 2022-05-26
- 发明人: Shachar Menashe , Ilya Khivrich , Asaf Karas
- 申请人: VDOO CONNECTED TRUST LTD.
- 申请人地址: IL Tel Aviv
- 专利权人: VDOO CONNECTED TRUST LTD.
- 当前专利权人: VDOO CONNECTED TRUST LTD.
- 当前专利权人地址: IL Tel Aviv
- 主分类号: G06F11/36
- IPC分类号: G06F11/36 ; G06F8/65 ; G06F8/52
摘要:
A method, system and product comprising determining a characterization of a terminal of a plurality of terminals within a binary code based on influences of the terminal, wherein the characterization of the terminal indicates a role of the terminal in the binary code; based on the characterization of the terminal, determining that the terminal is potentially affected by external input that is inputted to a device executing the binary code; determining for the terminal a corresponding propagation path within the binary code, wherein the propagation path indicates a reachability of the terminal within the binary code; locating in the binary code a code patch associated with a functionality of the binary code, wherein the code patch is associated with the propagation path of the terminal, wherein the code patch can be executed independently from the binary code; extracting the code patch from the binary code for testing; and generating an emulation of the code patch to enable fuzz testing of the emulation, whereby the code patch is tested independently.
公开/授权文献
- US11573887B2 Extracting code patches from binary code for fuzz testing 公开/授权日:2023-02-07
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