Invention Application
- Patent Title: MODEL ACCEPTANCE DETERMINATION SUPPORT SYSTEM AND MODEL ACCEPTANCE DETERMINATION SUPPORT METHOD
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Application No.: US17438370Application Date: 2020-03-06
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Publication No.: US20220164703A1Publication Date: 2022-05-26
- Inventor: Shin TEZUKA , Satoru MORIYA , Keisuke HATASAKI , Yoshiko YASUDA , Junji KINOSHITA
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Priority: JP2019-067721 20190329
- International Application: PCT/JP2020/009875 WO 20200306
- Main IPC: G06N20/00
- IPC: G06N20/00

Abstract:
In the information registered by a system, a learning model is associated with a dataset which is one or more dataset elements serving as an input of the learning model, and a dataset is associated with a filter of the dataset. The system evaluates the learning model using a processed dataset which is a dataset obtained on the basis of a dataset associated with an evaluation target learning model and a filter associated with the dataset. The system displays at least a part of information associated with a browsing target learning model and information indicating a result of evaluation of the learning model.
Information query