Invention Application
- Patent Title: System and Method for Periodic Beam Failure Measurements
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Application No.: US17541766Application Date: 2021-12-03
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Publication No.: US20220167191A1Publication Date: 2022-05-26
- Inventor: Young Hoon Kwon , Pengfei Xia
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04B17/309

Abstract:
A method for measuring beams includes determining a measurement period duration in accordance with periods of one or more periodic beam failure detection (BFD) reference signals (RSs) of a BFD RS set, wherein the BFD RSs of the one or more BFD RSs of the BFD RS set have a quasi-co-located (QCL) relationship with demodulation RSs (DMRSs) of PDCCH receptions monitored by a user equipment (UE), monitoring a subset of the one or more BFD RSs having the QCL relationship with the DMRSs of PDCCH receptions monitored by the UE that occur during a measurement period, and determining that measures of all BFD RSs in the subset of the one or more BFD RSs do not meet a specified threshold, and based thereon, reporting a beam failure (BF) instance.
Public/Granted literature
- US11825323B2 System and method for periodic beam failure measurements Public/Granted day:2023-11-21
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