• Patent Title: ABNORMALITY DETECTION APPARATUS, CONTROL METHOD, AND PROGRAM
  • Application No.: US17441374
    Application Date: 2019-03-27
  • Publication No.: US20220180495A1
    Publication Date: 2022-06-09
  • Inventor: Kyota HIGA
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • International Application: PCT/JP2019/013239 WO 20190327
  • Main IPC: G06T7/00
  • IPC: G06T7/00
ABNORMALITY DETECTION APPARATUS, CONTROL METHOD, AND PROGRAM
Abstract:
An abnormality detection apparatus (100) includes an acquisition unit (110) that acquires input data, an abnormality degree computation unit (120) that has a discriminative model for computing an abnormality degree of input data, inputs the acquired input data to the discriminative model, and thereby computes an abnormality degree of the input data, a normality degree computation unit (130) that has a normality model for computing a normality degree of input data, inputs the input data to the normality model, and thereby computes a normality degree of the input data, a determination unit (140) that has a determination model for performing determination relating to an abnormality level of input data, inputs the abnormality degree and the normality degree to the determination model, and thereby performs determination relating to an abnormality level of the input data, and an output unit (150) that outputs output information based on a result of the determination.
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