Invention Application
- Patent Title: SOLID-STATE IMAGING DEVICE, IMAGING SYSTEM, AND IMAGING METHOD
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Application No.: US17598532Application Date: 2020-02-05
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Publication No.: US20220182569A1Publication Date: 2022-06-09
- Inventor: Takashi WATANABE
- Applicant: TOPPAN INC.
- Applicant Address: JP Taito-ku
- Assignee: TOPPAN INC.
- Current Assignee: TOPPAN INC.
- Current Assignee Address: JP Taito-ku
- Priority: JP2019-065937 20190329
- International Application: PCT/JP2020/004437 WO 20200205
- Main IPC: H04N5/378
- IPC: H04N5/378 ; H04N5/3745 ; H04N5/369

Abstract:
[Problem] To provide a solid-state imaging device enabling summed-readout mode and cyclic-readout mode.
[Solution]
A device includes virtual-pixel units implemented by pixels of transfer-route controlling-scheme, the virtual-pixel units having a shape of polygon, the polygons are tessellated. The virtual-pixel unit encompasses a photoelectric-conversion region, charge detectors to which ordinal numbers are labeled, configured to accumulate signal charges transferred from the photoelectric-conversion region, and transfer-control elements configured to control movement of signal charges from the photoelectric-conversion region to one of the charge detectors. N pieces of charge detectors of the same ordinal number are arranged in boundary between the photodiodes and the intersection-shared sites. The intersection-shared site encompasses N pieces of switching elements having first main electrode connected to the charge detectors, and common signal-readout circuit having input terminals connected to second main electrode of each of the switching elements.
[Solution]
A device includes virtual-pixel units implemented by pixels of transfer-route controlling-scheme, the virtual-pixel units having a shape of polygon, the polygons are tessellated. The virtual-pixel unit encompasses a photoelectric-conversion region, charge detectors to which ordinal numbers are labeled, configured to accumulate signal charges transferred from the photoelectric-conversion region, and transfer-control elements configured to control movement of signal charges from the photoelectric-conversion region to one of the charge detectors. N pieces of charge detectors of the same ordinal number are arranged in boundary between the photodiodes and the intersection-shared sites. The intersection-shared site encompasses N pieces of switching elements having first main electrode connected to the charge detectors, and common signal-readout circuit having input terminals connected to second main electrode of each of the switching elements.
Public/Granted literature
- US11871134B2 Solid-state imaging device, imaging system, and imaging method Public/Granted day:2024-01-09
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