Invention Application
- Patent Title: INITIAL DISPLAY SUBSTRATE, INITIAL DISPLAY PANEL, DISPLAY PANEL AND INSPECTION METHOD THEREOF
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Application No.: US17486580Application Date: 2021-09-27
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Publication No.: US20220245845A1Publication Date: 2022-08-04
- Inventor: Xu XU , Biqiang HUANG , Shanshan XU , Wenchao WANG , Jixiang CHEN , Longgan HU
- Applicant: Fuzhou BOE Optoelectronics Technology Co., Ltd. , BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Fuzhou; CN Beijing
- Assignee: Fuzhou BOE Optoelectronics Technology Co., Ltd.,BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: Fuzhou BOE Optoelectronics Technology Co., Ltd.,BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Fuzhou; CN Beijing
- Priority: CN202110146037.5 20210202
- Main IPC: G06T7/60
- IPC: G06T7/60 ; H01L51/00 ; H01L51/52 ; H01L51/56

Abstract:
An initial display substrate comprising a product region and a to-be-processed region on periphery of the product region, the to-be-processed region comprising to-be-processed rounded corner regions at corners of the initial display substrate, each corner comprising major corner sides whose extension directions intersect, at least one to-be-processed rounded corner region comprising first positioning sub-region and two second positioning sub-regions, the major corner sides respectively defining edges of the second positioning sub-regions, the first positioning sub-region being between the second positioning sub-regions; first shielding blocks in the first positioning sub-region, each having arc shape protruding towards direction away from the product region, and the first shielding blocks being arranged in parallel at intervals; and second shielding blocks in each second positioning sub-region, the second shielding blocks being arranged in periodic pattern different from pattern of shielding blocks in a region of the to-be-processed region other than the to-be-processed rounded corner regions.
Public/Granted literature
- US12131495B2 Initial display substrate, initial display panel, display panel and inspection method thereof Public/Granted day:2024-10-29
Information query