Invention Application
- Patent Title: MEASUREMENT METHOD, APPARATUS, AND SYSTEM
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Application No.: US17725049Application Date: 2022-04-20
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Publication No.: US20220248245A1Publication Date: 2022-08-04
- Inventor: Meng HUA , Yi LONG , Shurong JIAO
- Applicant: HUAWEI TECHNOLOGIES CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04W72/04 ; H04L1/00

Abstract:
Example measurement methods and apparatus are described. One example method includes receiving first information and second information from a network device by a terminal device. The terminal device determines a first resource based on the first information, and determines a second resource based on the second information. Further, the terminal device determines a third resource based on the first resource and the second resource, and performs measurement on the third resource. The third resource includes a part of or all resources in the first resource except a first overlapping resource, and the first overlapping resource is an overlapping resource of the first resource and the second resource.
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