Invention Application
- Patent Title: THREE-DIMENSIONAL POSITION MEASURING SYSTEM, MEASURING METHOD, AND MEASURING MARKER
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Application No.: US17581308Application Date: 2022-01-21
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Publication No.: US20220252396A1Publication Date: 2022-08-11
- Inventor: Takeshi KIKUCHI
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2021-017936 20210208
- Main IPC: G01C15/00
- IPC: G01C15/00 ; G01C11/02 ; G01S17/86 ; G01S17/89 ; G01S17/42 ; G01P15/18

Abstract:
A three-dimensional position measuring system includes a surveying instrument including a distance-measuring section, an imaging section, an angle-measuring section, a drive section configured to drive the distance-measuring section to set angles, and a communication section, and a measuring marker including a position sensor, a posture sensor, a laser emitting section configured to emit laser light of visible light in an axial direction, an emission port for the laser light, and a communication section, wherein the measuring marker calculates position information and posture information of the emission port from the position sensor and the posture sensor and transmits the information to the surveying instrument, and the surveying instrument measures a three-dimensional position of the emission port, grasps the axial direction based on the posture information and searches for a measurement point in the axial direction by the imaging section, and measures a three-dimensional position of the measurement point.
Information query