Invention Application
- Patent Title: ROBUST, HIGH TRANSMISSION PELLICLE FOR EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMS
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Application No.: US17728945Application Date: 2022-04-25
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Publication No.: US20220252986A1Publication Date: 2022-08-11
- Inventor: Yun-Yue LIN
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03F1/64

Abstract:
A robust, high-transmission pellicle for extreme ultraviolet lithography systems is disclosed. In one example, the present disclosure provides a pellicle that includes a membrane and a frame supporting the membrane. The membrane may be formed from at least one of a transparent carbon-based film and a transparent silicon based film. The at least one of the transparent carbon-based film and the transparent silicon based film may further be coated with a protective shell. The frame may include at least one aperture to allow for a flow of air through a portion of the pellicle.
Public/Granted literature
- US11656544B2 Robust, high transmission pellicle for extreme ultraviolet lithography systems Public/Granted day:2023-05-23
Information query
IPC分类: