- 专利标题： SCINTILLATOR ARRAY, METHOD FOR MANUFACTURING SCINTILLATOR ARRAY, RADIATION DETECTOR, AND RADIATION INSPECTION DEVICE
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申请号： US17660861申请日： 2022-04-27
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公开(公告)号： US20220260731A1公开(公告)日： 2022-08-18
- 发明人: Hiroyasu KONDO , Yukihiro FUKUTA , Kazumitsu MORIMOTO , Makoto HAYASHI
- 申请人： KABUSHIKI KAISHA TOSHIBA , TOSHIBA MATERIALS CO., LTD.
- 申请人地址： JP Tokyo; JP Yokohama-Shi
- 专利权人： KABUSHIKI KAISHA TOSHIBA,TOSHIBA MATERIALS CO., LTD.
- 当前专利权人： KABUSHIKI KAISHA TOSHIBA,TOSHIBA MATERIALS CO., LTD.
- 当前专利权人地址： JP Tokyo; JP Yokohama-Shi
- 优先权： JP2019-205706 20191113
- 主分类号： G01T1/20
- IPC分类号： G01T1/20 ; G01T1/203
摘要：
A scintillator array includes: a structure having scintillator segments and a first reflective layer, the first reflective layer being provided between the scintillator segments and being configured to reflect light, and the scintillator segments having a sintered compact containing a rare earth oxysulfide phosphor; and a layer having a second reflective layer provided above the structure, the second reflective layer being configured to reflect light. The first reflective layer has a portion extending into the layer.
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